Abstract

Creating behavioral models for radio frequency (RF) devices is a challenging task. Most approaches require a substantial prior knowledge of the physical structure in order to be able to generate suitable mathematical models for the desired characteristics. However, since it is usually not attractive for manufacturers to pass on extensive knowledge about internal components to third parties, one has to rely mainly on black- or gray-box models. An approach is to fit a parameterized model based on representative measurement data, following the example of the Hammerstein-Wiener models. With this approach, only simple linear least squares problems have to be solved and special structures encourage the use of efficient solution methods. In this paper, the general fitting procedure will be discussed and suggestions for successful device modeling will be provided.